X-ray diffraction analysis and impedance spectroscopy measurements were employed to study the influence of the structural characteristics on the electrical properties. The formation of the orthorhombic phase for all samples with a decrease in the unit cell volume was due to insertion of Mg2þ into Ti4þ sites.
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Effects of MgO on dielectric relaxation and phase transition of the ceramic matrix BaBi4Ti4O15
Effects of MgO on dielectric relaxation and phase transition of the ceramic matrix BaBi4Ti4O15
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Doped BaBi4Ti4O15 ceramics Dielectric relaxation Phase transition Impedance spectroscopy Ionic conductivity Advanced materials and devicesTài liệu có liên quan:
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